Low-Temperature Microprobe station
Welcome to the forefront of precision testing and characterization with the SATs Micro-Probe Station. Engineered to excel in semiconductor research, materials science, and beyond, this innovative system integrates cutting-edge technology with robust design features to meet the diverse needs of modern laboratories.
Key Specifications
Temperature Versatility
Operates flanklessly across a wide temperature range, Stage Temperature: From -40°C to 120°C without the need for liquid nitrogen (LN), or ambient (Room Temperature, RT) to 350°C for high-temperature applications.
Vacuum Compatibility
Maintains stability and precision under vacuum conditions up to 5×10 −2 Torr, ensuring reliable measurements in controlled environments.
Optical Characterization Capability
Equipped with an upper quartz optical window, enabling advanced opto-electric and photo-catalytic characterization. This feature supports detailed analysis of optical and electrochemical properties crucial for cutting-edge research.
Electrode Configuration
Features four pure tungsten electrodes, each with a 50-micrometer tip size, providing superior electrical contact and versatility for probing various materials and devices.
XYZ Positioning Control
Offers precise control in X, Y, and Z directions, facilitating accurate alignment and measurement of microelectronic components.
Compatibility with Electrical Measurement Devices:
Seamlessly connects with LCR meters, Potentiostats, and other electrical measurement devices. This capability allows comprehensive electrical characterization, including impedance spectroscopy, electrochemical measurements, and more..
Applications
Widely used in the semiconductor R&D
Seamlessly connects with LCR meters, Potentiostats, and other electrical measurement devices. This capability allows comprehensive electrical characterization, including impedance spectroscopy, electrochemical measurements, and more..