3 Semiconductor Analysis and Testing Solutions India
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Cryogenic Probe Station

Engineered for advanced semiconductor and material research, the SATs Cryogenic Probe Station delivers high accuracy, wide temperature range, and stable performance for precise electrical characterization under controlled thermal conditions.

Key Specifications

Temperature Range

Operates from −196°C to +300°C, with optional upgrades available for +400°C or +550°C to suit advanced experimental requirements.

Heating Rate

Supports rapid heating up to 50°C per minute, ensuring efficient thermal cycling and process optimization.

Cooling Rate

Provides controlled cooling at rates up to 20°C per minute for precise temperature management during experiments.

Temperature Stability / Resolution

Maintains excellent stability with ±0.1°C accuracy, ensuring repeatable and reliable temperature control.

Control System

Features a PID closed-loop control mechanism integrated with a high-precision PT100 sensor for accurate temperature regulation and feedback.

Optional Add-ons

Source Meter Integration – Enables precise current-voltage measurements and automated electrical characterization.

Vacuum Environment System – Allows experiments under controlled vacuum conditions to minimize contamination and thermal loss.

Humidity Control Module – Provides precise humidity regulation for sensitive material testing and environmental simulations.

Custom Software Solutions – Offers user-defined automation, data logging, and remote control capabilities for advanced research workflows.

Applications

Semiconductor Device Testing – Ideal for evaluating electrical, thermal, and mechanical performance of semiconductor components under varying conditions.

Cryogenic and High-Temperature Material Studies – Facilitates analysis of material properties across extreme temperature ranges.

Electrical and Optical Characterization – Supports comprehensive analysis of conductivity, photoluminescence, and optoelectronic behaviors.

Sensor and MEMS Research – Suitable for testing micro-electromechanical systems and advanced sensor prototypes with high precision.

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