Externally Probe-Controlled Cryogenic Probe Station
The SATS Externally Probe-Controlled Cryogenic Probe Station is a high-precision platform designed for temperature-dependent electrical and material characterization. It enables researchers to perform accurate probing, measurement, and observation from cryogenic to high-temperature environments without breaking the vacuum, ensuring measurement consistency and sample integrity.
Specifications
Continuous Operation Without Vacuum Break
External probe control enables repositioning or switching electrical contacts between electrodes without venting or breaking the vacuum chamber, significantly reducing downtime and maintaining clean, stable measurement conditions.
Wide Temperature Range
Supports operation from –196°C to +300°C, with optional upgrades up to +550°C, accommodating a wide range of experimental requirements from cryogenic to high-temperature studies.
Fast and Stable Thermal Control
Offers heating rates up to 50°C per minute and cooling rates up to 20°C per minute. Equipped with PID closed-loop control and a PT100 sensor for precise temperature management, achieving ±0.1°C stability and resolution for reproducible results.
Vacuum & Gas-Compatible Design
Engineered for integration with vacuum systems and compatible with protective gases (such as N₂), ensuring oxidation-free testing and reliable material performance evaluation.
Optical Access
Incorporates an optical window for in-situ microscopic or camera-based observation, enabling real-time visual monitoring during experiments.
External Probe Mechanism
Provides smooth and precise probe movement from outside the chamber, allowing easy electrode adjustment or switching under controlled environmental conditions.
Applications
Semiconductor and Nanodevice Characterization – Facilitates detailed electrical and thermal analysis of semiconductor and nanoscale devices under controlled environments.
Temperature-Dependent I–V and C–V Measurements – Enables precise current–voltage and capacitance–voltage testing across variable temperature ranges.
Superconducting and Cryogenic Material Studies – Suitable for low-temperature analysis of superconducting materials and cryogenic phenomena.
Hall Effect and Contact Resistance Testing – Supports mobility, carrier concentration, and contact resistance measurements critical for semiconductor research.
Sensor and MEMS Device Evaluation – Ideal for performance assessment of micro-electromechanical systems and various sensor technologies under controlled thermal and vacuum conditions.